A Double Gate Cell FeRAM with Non-Destructive Read Out(NDRO) and Random Access Scheme for Nanoscale and Terabit Nonvolatile Memory

  • Sung, Man Young
제목
A Double Gate Cell FeRAM with Non-Destructive Read Out(NDRO) and Random Access Scheme for Nanoscale and Terabit Nonvolatile Memory
저자
Sung, Man Young
학회명
International Symposium on Integrated Ferroelectrics(ISIF)
개최지
Shanghai, China
학회 개최일
2005-04-17 ~ 2005-04-20