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New Anomaly Detection in Semiconductor Manufacturing Process using Oversampling Method
New Anomaly Detection in Semiconductor Manufacturing Process using Oversampling Method
- 제목
- New Anomaly Detection in Semiconductor Manufacturing Process using Oversampling Method
- 제목 (타언어)
- New Anomaly Detection in Semiconductor Manufacturing Process using Oversampling Method
- 저자
- Jun-Geol Baek
- 발행일
- 2020-02-23
- 학회명
- 12th International Conference on Agents and Artificial Intelligence (ICAART 2020)
- 개최지
- Valletta, Malta
- 개최국가
- 몰타
- 학회 개최일
- 2020-02-22 ~ 2020-02-24