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An investigation of the damage mechanisms in impact ionization-induced “Mixed-mode” reliability stressing of scaled SiGe HBTs
- 제목
- An investigation of the damage mechanisms in impact ionization-induced “Mixed-mode” reliability stressing of scaled SiGe HBTs
- 저자
- Rieh, Jae-Sung
- 학회명
- International Electron Devices Meeting
- 학회 개최일
- 2003-12-08 ~ 2003-12-10