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Passivation of semi-insulating polycrystalline CdZnTe films
- Kim, Ki Hyun;
- Won, Jae Ho;
- Cho, Shin Hang;
- Suh, Jong Hee;
- Cho, Pyong Kon;
- ... Hong, Jinki;
- 외 2명
Citations
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10초록
Surface effects play an important role in the overall performance of X-ray detector. The effects of passivation with (NH4)(2)S on semi-insulating polycrystalline CdZnTe thick films were analyzed with X-ray photoelectron spectroscopy (XPS), photoconductive decay (PCD), noise power spectrum and pulse height spectra measurements. Sulfur passivation with (HN4)(2)S effectively removes the Te-oxide layers on the CdZnTe surface, reduces the surface leakage current and gives higher energy resolution by suppressing 1/f noise.
키워드
sulfur passivation; leakage current; CdTeS; heterojunction; semi-insulating CdZnTe; inter-pixel resistance; 1/f noise; SULFUR TREATMENT; RAY; DETECTOR; QUALITY; SYSTEM
- 제목
- Passivation of semi-insulating polycrystalline CdZnTe films
- 저자
- Kim, Ki Hyun; Won, Jae Ho; Cho, Shin Hang; Suh, Jong Hee; Cho, Pyong Kon; Hong, Jinki; Kim, Sun Ung; Han, You Ree
- 발행일
- 2008-07
- 유형
- Article; Proceedings Paper
- 권
- 53
- 호
- 1
- 페이지
- 317 ~ 321
- 언어
- ENG
- 출판사
- KOREAN PHYSICAL SOC
- 발행국가
- 대한민국
- 분량
- 5 페이지
- ISSN
- E 1976-8524
P 0374-4884