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F-18 Half-life measurement using 2-gamma coincidence method
- Kang, Y. S.;
- Ahn, J. K.;
- Kim, S. H.;
- Byun, J. I.;
- Han, J. B.;
- 외 1명
WEB OF SCIENCE
4SCOPUS
4초록
The accuracy of the half-life measurement of short-lived radioisotopes such as positron-emitting F-18 (tau(1/2) approximate to 100 min) is limited mainly by inaccuracies in the detector counting statistics. Gamma-ray measurement with a high-activity F-18 source requires counting-loss corrections to compensate for random summing effects and the detector's dead time. In this study, we measure the half-life of F-18 with two 511-keV gamma-rays using two high-purity germanium (HPGe) detectors. The counting-loss corrections are performed via two approaches to address the problems of random coincidence summing and dead time: a half-life measurement with a Na-22 source and a Geant4 simulation of the detector response. Variations in the full-width at half maximum (FWHM) of the 511-keV peak are found to show good correlation with the random summing effect. The half-life of F-18 is estimated as 109.73 +/- 0.14 min. (C) 2015 Elsevier B.V. All rights reserved.
키워드
- 제목
- F-18 Half-life measurement using 2-gamma coincidence method
- 저자
- Kang, Y. S.; Ahn, J. K.; Kim, S. H.; Byun, J. I.; Han, J. B.; Lee, K. B.
- 발행일
- 2015-11-21
- 유형
- Article
- 권
- 801
- 페이지
- 7 ~ 10
- 언어
- ENG
- 출판사
- ELSEVIER
- 발행국가
- 네덜란드
- 분량
- 4 페이지
- ISSN
- E 1872-9576
P 0168-9002