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Wafer level forward current reliability analysis of 120GHz production SiGe HBTs under accelerated current stress
- 제목
- Wafer level forward current reliability analysis of 120GHz production SiGe HBTs under accelerated current stress
- 저자
- Rieh, Jae-Sung
- 학회명
- 2002 International Reliability Physics Symposium
- 학회 개최일
- 2002-04-07 ~ 2002-04-11