상세 보기
언어
ISSN
P 1229-4039 E 2734-0481
출판사
한국언어학회
국가
SOUTH KOREA
발행 상태
비활성
데이터베이스 수록 정보
KCI 2009-2025 (17년)
KCI 등재 2001-2026 (26년)
KCI 등재후보 1999-2001 (3년)
전체 57건 중 1번부터 10번까지의 결과를 표시합니다.
2026
Article
Reduced Leakage and Enhanced Endurance via an ITO Oxygen Reservoir Layer in HZO Ferroelectric Capacitors
- Choi, Haevin ;
- Park, Hyeonjung ;
- Han, Changwoo ;
- Choi, Myeongjae ;
- Choi, Yejoo ;
- ... Shin, Changhwan
- 2026-04
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2025
Article
Effect of Bottom Electrode Annealing Temperature and Atmosphere on Endurance Characteristics of Ferroelectric Hf0.5Zr0.5O2 Capacitors
- Park, Hyeonjung ;
- Han, Changwoo ;
- Choi, Yejoo ;
- Choi, Myeongjae ;
- Won, Sangmin ;
- ... Shin, Changhwan
- 2025-11
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2023
Article
Excellent Improvement of Contact Resistivity and Thermal Stability for High Temperature Process After Silicidation of TiSi2 Through Ta Interlayer for Diffusion Barrier
- Kim, Min-Su ;
- Hwang, Seong-Hyun ;
- Kim, Seung-Hwan ;
- Kim, Jong-Hyun ;
- Park, Euyjin ;
- ... Yu, Hyun-Yong ;
- 외 1명
- 2023-07
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Impact of CF4/O2Plasma Passivation on Endurance Performance of Zr-Doped HfO2Ferroelectric Film
- Choi, Yejoo ;
- Park, Hyeonjung ;
- Han, Changwoo ;
- Shin, Changhwan
- 2023-05-01
- IEEE Electron Device Letters
- Institute of Electrical and Electronics Engineers Inc.
2022
Article
Impact of Various Pulse-Bases on Charge Boost in Ferroelectric Capacitors
- Kim, Gwon ;
- Lim, Jaehyuk ;
- Eom, Deokjoon ;
- Choi, Yejoo ;
- Kim, Hyoungsub ;
- ... Shin, Changhwan
- 2022-11
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2021
Article
Single Silicon Neuron Device Enabling Neuronal Oscillation and Stochastic Dynamics
- Lim, D. ;
- Cho, K. ;
- Kim, S.
- 2021-05
- IEEE Electron Device Letters
- Institute of Electrical and Electronics Engineers Inc.
2020
Article
Analysis of Drain Linear Current Turn-Around Effect in Off-State Stress Mode in pMOSFET
- Jung, Seung-Geun ;
- Lee, Sul-Hwan ;
- Kim, Choong-Ki ;
- Yoo, Min-Soo ;
- Yu, Hyun-Yong
- 2020-06
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2019
Article
Impact of Bottom-Gate Biasing on Implant-Free Junctionless Ge-on- Insulator n-MOSFETs
- Lim, Hyeong-Rak ;
- Kim, Seong Kwang ;
- Han, Jae-Hoon ;
- Kim, Hansung ;
- Geum, Dae-Myeong ;
- ... Ju, Byeong-Kwon ;
- 외 3명
- 2019-09
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2018
Article
Low-Temperature Hybrid Dopant Activation Technique Using Pulsed Green Laser for Heavily-Doped n-Type SiGe Source/Drain
- Kim, Seung-Geun ;
- Kim, Gwang-Sik ;
- Kim, Seung-Hwan ;
- Yu, Hyun-Yong
- 2018-12
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
A Simple Method for Estimation of Silicon Film Thickness in T-Gate Junction less Transistors
- Jeon, Dae-Young ;
- Park, So Jeong ;
- Mouis, Mireille ;
- Barraud, Sylvain ;
- Kim, Gyu-Tae ;
- 외 1명
- 2018-09
- IEEE Electron Device Letters
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
1