Cho, Jae Hun; Kim, Hoon; Wang, Sihai; Lee, Jaehoon; Lee, Hanlim; Hwang, Seongtaek; Cho, Sungdae; Oh, Yunje; Lee, Tae-Jin
ArticleIssue Date2009CitationIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.58, no.8, pp.2824 - 2829PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC