Ryu, Sun Young; Ajimura, Shuhei; Kobayakawa, Ryo; Mizutani, Keigo; Yosoi, Masaru; Watanabe, Ken; Sada, Yuta; Hotta, Tomoaki; Ishikawa, Takatsugu; Niiyama, Masayuki, et al.
ArticleIssue Date2025CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.72, no.3, pp 348 - 354PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC