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IEEE Embedded Systems Letters
ISSN
P 1943-0663 E 1943-0671
출판사
Institute of Electrical and Electronics Engineers
국가
USA
발행 상태
활성
데이터베이스 수록 정보
CiteScore 2011-2025 (15년)
ESCI 2016-2018 (3년)
JCR 2018-2025 (8년)
SCIE 2018-2026 (9년)
Scopus 2009-2026 (18년)
SJR 2010-2020, 2022-2025 (15년)
전체 4건 중 1번부터 4번까지의 결과를 표시합니다.
2021
Article
Remote embedded devices test framework on the cloud
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- 2021
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2020
Article
Automatic monitoring of service reliability for web applications: a simulation-based approach
- Kim, Sundeuk ;
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- Chung, Yon Dohn
- 2020-09
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2014
Article
Automated test case generation for FBD programs implementing reactor protection system software
- Jee, Eunkyoung ;
- Shin, Donghwan ;
- Cha, Sungdeok ;
- Lee, Jang-Soo ;
- Bae, Doo-Hwan
- 2014-12
- Software Testing Verification and Reliability
- WILEY
2010
Article
A systematic representation of path constraints for implicit path enumeration technique
- Kim, Tai Hyo ;
- Bang, Ho Jung ;
- Cha, Sung Deok
- 2010-03
- Software Testing Verification and Reliability
- WILEY