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IEEE Photonics Technology Letters
ISSN
P 1041-1135 E 1941-0174
출판사
Institute of Electrical and Electronics Engineers
국가
USA
발행 상태
활성
데이터베이스 수록 정보
CiteScore 2011-2025 (15년)
JCR 1997-2025 (29년)
SCI 2010-2019 (10년)
SCIE 2010-2026 (17년)
Scopus 1989-2026 (38년)
SJR 1999-2020, 2022-2025 (26년)
전체 5건 중 1번부터 5번까지의 결과를 표시합니다.
2026
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2019
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A Parasitics-Induced Failure Mechanism for Transistors in the Bit-Line Sense Amplifier Region of DDP DDR3 DRAM During a CDM Event
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- Kim, Chulwoo
- 2019-12
- IEEE Transactions on Device and Materials Reliability
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2013
Article
Bipolar Resistive-Switching Phenomena and Resistive-Switching Mechanisms Observed in Zirconium Nitride-Based Resistive-Switching Memory Cells
- Kim, Hee-Dong ;
- An, Ho-Myoung ;
- Sung, Yun Mo ;
- Im, Hyunsik ;
- Kim, Tae Geun
- 2013-03
- IEEE Transactions on Device and Materials Reliability
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2010
Article
Negative-/Positive-Bias-Instability Analysis of the Memory Characteristics Improved by Hydrogen Postannealing in MANOS Capacitors
- Kim, Hee-Dong ;
- An, Ho-Myoung ;
- Seo, Yujeong ;
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- Kim, Tae Geun
- 2010-06
- IEEE Transactions on Device and Materials Reliability
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC