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Nature Methods
ISSN
P 1548-7091 E 1548-7105
출판사
Nature Publishing Group
국가
ENGLAND
발행 상태
활성
데이터베이스 수록 정보
CiteScore 2011-2025 (15년)
EMBASE 2016-2026 (11년)
JCR 2004-2025 (22년)
MEDLINE 2016-2024 (9년)
SCI 2010-2019 (10년)
SCIE 2010-2026 (17년)
Scopus 2004-2026 (23년)
SJR 2005-2020, 2022-2025 (20년)
전체 16건 중 1번부터 10번까지의 결과를 표시합니다.
2025
Article
Risk of CuxO phase penetration between the Ag plating layer and Cu during high-temperature reliability testing of interfaces bonded to cold sintered Ag nano-porous sheets on direct Ag-plated Cu substrates
- Kim, Yehri ;
- Jo, Eunjin ;
- Ju, Byeong Kwon ;
- Lee, Yoongul ;
- Kim, Jaeup ;
- 외 3명
- 2025-05
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
Article
Heat-resistant durability of AMB substrates for SiC power devices: AlN and Si3N4, which one is thermally strong?
- Kim, Yun-Chan ;
- Yu, Dong-Yurl ;
- Kim, Shin-Il ;
- Kim, Yong-Mo ;
- Byun, Dongjin ;
- 외 2명
- 2025-04
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2023
Article
Thermal reliability of Cu sintering joints for high-temperature die attach
- Son, Junhyuk ;
- Yu, Dong-Yurl ;
- Kim, Yun-Chan ;
- Kim, Shin-Il ;
- Byun, Dongjin ;
- 외 1명
- 2023-08
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2022
Article
Performance analysis of coloured BIPV systems depending on reliability of irradiance data
- Jeong, Sookyung ;
- Jang, Juhee ;
- Park, Indoo ;
- Jo, Sun keun ;
- Lim, Jungtek ;
- ... Lee, Hae-seok ;
- 외 2명
- 2022-11
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2021
Article
Analysis of the impact of power loss due to snail trails in a 95-kWp photovoltaic power system
- Oh, Wonwook ;
- Choi, Hoonjoo ;
- Kim, Donghwan
- 2021-11
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2020
Article
Evaluation based on performance and failure of PV system in 10 years field-aged 1 MW PV power plant
- Oh, Wonwook ;
- Choi, Hoonjoo ;
- Seo, Kun Won ;
- Kim, Daesung ;
- Kim, So-Yeon ;
- ... Lee, Hae-Seok ;
- 외 2명
- 2020-11
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2019
Article
Analysis of degradation in 25-year-old field-aged crystalline silicon solar cells
- Oh, Wonwook ;
- Bae, Soohyun ;
- Kim, Seongtak ;
- Park, Nochang ;
- Chan, Sung-Il ;
- 외 3명
- 2019-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2018
Article
Initial detection of potential-induced degradation using dark I-V characteristics of crystalline silicon photovoltaic modules in the outdoors
- Oh, Wonwook ;
- Bae, Soohyun ;
- Kim, Donghwan ;
- Park, Nochang
- 2018-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2017
Article
Field degradation prediction of potential induced degradation of the crystalline silicon photovoltaic modules based on accelerated test and climatic data
- Oh, Wonwook ;
- Bae, Soohyun ;
- Chan, Sung-Il ;
- Lee, Hae-Seok ;
- Kim, Donghwan ;
- 외 1명
- 2017-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
2016
Article
Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection
- Oh, Wonwook ;
- Kim, Junhee ;
- Kang, Byungjun ;
- Bae, Soohyun ;
- Lee, Kyung Dong ;
- ... Lee, Hae-Seok ;
- 외 2명
- 2016-09
- Microelectronics and Reliability
- PERGAMON-ELSEVIER SCIENCE LTD
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