ScholarWorks@Korea University: KWON, Oh Myoung

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KWON, Oh Myoung (권오명)

공과대학 (기계공학부)

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Tel 3371
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thermal conductivity:5||Thermal Contact Resistance:2||effective thermal conductivity:2||Graphene:2||ballisticdiffusive equations:2||phonon mean free path spectrum:2||Quantitative measurement:2||Nullpoint scanning thermal microscopy:2||Scanning thermal microscopy:2||temperature measurement:2||Phonon mean free path:2||ballistic thermal resistance:2||quantitative profiling:2||Twin cleanroom experiment (트윈 클린룸 실험):1||Phase separation:1||Thermal Conductivity:1||Nullpoint method:1||Scanning Seebeck microscopy:1||thermocouple probe:1||Energy Consumption:1||contact resistance:1||CVD coatings:1||Electrostatic self assembly:1||TwistingType(비틀림형):1||heat transfer:1||copper:1||3 omega Method:1||Colloidal Stability:1||열저항 탐침:1||Thermoelectric:1||Silicononinsulator transistor:1||Scanning thermal microscopy (SThM):1||Thermometry:1||Diamond Patterns:1||distortion:1||distance measurement:1||semiconductor thin films:1||Electrostatic SelfAssembly:1||charge injection:1||Thermoresistive Probe:1||Undisturbed temperature:1||Electric power consumption(소비전력량):1||Ag2Te:1||Nanoscale thermal measurement:1||diamond thermocouple probe:1||scanning thermal microscopy:1||Power Consumption Per Unit Load:1||Steam Humidification:1||Water Spray Humidification:1||electric heating:1||thermal resistance:1||nondestructive testing:1||elemental semiconductors:1||porosity:1||molecular dynamics simulation:1||thermal property:1||Semiconductor manufacturing cleanroom(반도체 클린룸):1||Ultrathin oxide tip:1||Thermal time constant:1||temperature:1||Lateral Force Nanocrystalline:1||carbon nanotubes:1||Nano diamond:1||aluminium:1||thermal stability:1||phase change material:1||3 omega method:1||grain size effect:1||Null point scanning thermal microscope:1||Thermal sensitivity:1||Nanoscale temperature measurement:1||Scanning Thermal Microscopy:1||Nanostructure:1||carrier density:1||Outdoor Air Conditioning System:1||Hot filament CVD:1||Seeding:1||heat sinks:1||Thermoelectric Probe:1||Atomic force microscope:1||Interface:1||Scanning thermal microscope:1||Scanning Thermal Wave Microscopy:1||nanometer resolution:1||NanoTribology:1||diamond:1||Thermal Actuator(열 구동기):1||electrodes:1||polymers:1||주사탐침열현미경:1||velocity autocorrelation function:1||Thermal resistance:1||Indoor water spray humidification(실내 수분무가습):1||(Bi,Sb)(2)Te3:1||Thermal conductance:1||thermopower:1||photothermal effects:1||thermal conductivity measurement:1||Thickness control:1||NanoDiamond:1||Micromirror(마이크로 거울):1||organic light emitting diodes:1||Effective Thermal Conductivity:1||Nanofluid:1||carbon nanotube:1||selfdiffusion coefficient of hydrogen molecules:1||GST:1||Onefluid nozzle(일유체 노즐):1||CVD:1||Hotspot:1||Scanning Null Point Microscopy:1||Temperature Profiling:1||Quantitative temperature profiling:1||Clean Room:1||CVD Diamond Film:1||Nucleation Density:1||SiO2:1||sensors:1||열전탐침:1||Scanning Thermal Microscope: SThM:1||density functional theory:1||

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