ScholarWorks@Korea University: Hong, Jin Ki

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Hong, Jin Ki (홍진기)

College of Science and Technology

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Tel 044-860-1329
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Bridgman technique:3||Xray detector:3||Solar cell:3||Zeeman:2||CdZnTe:2||Cadmium compounds:2||Semiconducting IIVI materials:2||HgCdTe:2||gfactor:2||Spin polarization:2||Barrier height:1||CdZnTe (CZT):1||Schottkytunnelbarrier:1||semiinsulating CdZnTe:1||surface:1||heterojunctions:1||transistors:1||ㅊC:1||Transitionmetal dichalcogenides:1||Superconductivity:1||CoFeB/MgO:1||CdS thin film:1||Polycrystalline:1||Leakage current:1||1/f noise:1||type conversion:1||multiple compensation:1||in situ annealing:1||Te inclusions:1||LAO/STO:1||XPS:1||semiconducting IIIV materials:1||semiinsulating:1||thick films:1||doping:1||Effective mass:1||Shubnikovde Haas oscillation:1||Magnetoresistance:1||CdS/CdTe:1||MicroHall sensor:1||2DEG:1||Perpendicular magnetization:1||CdMnTe:1||biosensors:1||Hall effect transducers:1||Nonmagnetic semiconductor:1||gradiometry:1||Cadmium sulfide:1||Copper telluride:1||Magnetic flux:1||Rashba Effect:1||Magnetoconductance:1||Defects:1||Spin injection efficiency:1||Rashba:1||sulfur passivation:1||Xray spectrum:1||heavy metal doping:1||Cadmium telluride:1||Time of flight:1||Freon treatment:1||homojunctions:1||silicon:1||WTe2:1||Xray topography:1||Spin injection:1||microsensors:1||leakage current:1||heterojunction:1||CdZnTe : Pb:1||Cu2Te:1||Schottky barrier:1||Nb microring:1||SpinOrbit Interaction:1||STTMRAM:1||CdCl2 annealing:1||Spinflip:1||Schottky diode:1||CdTeS:1||interpixel resistance:1||passivation:1||CdS:1||magnetic particle:1||biosensor:1||diodes:1||transition metal dichalcogenides:1||CZT detectors:1||pulseheight analyzers:1||Doping:1||Point defects:1||Interface resistance:1||surface processes:1||polycrystalline CdZnTe:1||Cl activation:1||

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