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Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures

Adam, A. J. L.; Brok, J. M.; Seo, M. A.; Ahn, K. J.; Kim, D. S.; Kang, J. H.; Park, Q. H.; Nagel, M.; Planken, P. C. M.

ArticleIssue Date2008CitationOPTICS EXPRESS, v.16, no.10, pp 7407 - 7417PublisherOPTICAL SOC AMER

SCIESCOPUS

Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum

Adam, A. J. L.; Brok, J. M.; Seo, M. A.; Ahn, K. J.; Kim, D. S.; Kang, J. H.; Park, Q. H.; Nagel, M.; Planken, P. C. M.

ArticleIssue Date2008CitationOPTICS EXPRESS, v.16, no.11, pp 8054 - 8054PublisherOPTICAL SOC AMER

SCIESCOPUS

Near field imaging of terahertz focusing onto rectangular apertures

Seo, M. A.; Adam, A. J. L.; Kang, J. H.; Lee, J. W.; Ahn, K. J.; Park, Q. H.; Planken, P. C. M.; Kim, D. S.

ArticleIssue Date2008CitationOPTICS EXPRESS, v.16, no.25, pp 20484 - 20489PublisherOPTICAL SOC AMER

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Browsing by Adam, A. J. L.Author

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