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Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum

Authors
Adam, A. J. L.Brok, J. M.Seo, M. A.Ahn, K. J.Kim, D. S.Kang, J. H.Park, Q. H.Nagel, M.Planken, P. C. M.
Issue Date
26-5월-2008
Publisher
OPTICAL SOC AMER
Citation
OPTICS EXPRESS, v.16, no.11, pp.8054 - 8054
Indexed
SCIE
SCOPUS
Journal Title
OPTICS EXPRESS
Volume
16
Number
11
Start Page
8054
End Page
8054
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/123520
DOI
10.1364/OE.16.008054
ISSN
1094-4087
Abstract
An erratum is presented to correct an error in the discussion section of [Opt. Express. 16, 7407-7417 (2008)] and to add a relevant reference on earlier work. (c) 2008 Optical Society of America.
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