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Defect Engineering for High Performance and Extremely Reliable a-IGZO Thin-Film Transistor in QD-OLED

Park, Young-Gil; Cho, Dong Yeon; Kim, Ran; Kim, Kang Hyun; Lee, Ju Won; Lee, Doo Hyoung; Jeong, Soo Im; Ahn, Na Ri; Lee, Woo-Geun; Choi, Jae Beom, et al.

ArticleIssue Date2022CitationADVANCED ELECTRONIC MATERIALS, v.8, no.7PublisherWILEY
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