Suh, J.; Hwang, S.; Yu, H.; Yoon, Y.; Bolotnikov, Aleksey E.; James, Ralph B.; Hong, J.; Kim, Kihyun
ArticleIssue Date2017CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.64, no.12, pp.2966 - 2969PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC