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Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures

Adam, A. J. L.; Brok, J. M.; Seo, M. A.; Ahn, K. J.; Kim, D. S.; Kang, J. H.; Park, Q. H.; Nagel, M.; Planken, P. C. M.

ArticleIssue Date2008CitationOPTICS EXPRESS, v.16, no.10, pp 7407 - 7417PublisherOPTICAL SOC AMER

SCIESCOPUS

Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum

Adam, A. J. L.; Brok, J. M.; Seo, M. A.; Ahn, K. J.; Kim, D. S.; Kang, J. H.; Park, Q. H.; Nagel, M.; Planken, P. C. M.

ArticleIssue Date2008CitationOPTICS EXPRESS, v.16, no.11, pp 8054 - 8054PublisherOPTICAL SOC AMER

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Browsing by Brok, J. M.Author

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