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SCIESCOPUS
Impact of Chamber/Annealing Temperature on the Endurance Characteristic of Zr:HfO2 Ferroelectric Capacitoropen access

Choi, Yejoo; Han, Changwoo; Shin, Jaemin; Moon, Seungjun; Min, Jinhong; Park, Hyeonjung; Eom, Deokjoon; Lee, Jehoon; Shin, Changhwan

ArticleIssue Date2022CitationSENSORS, v.22, no.11PublisherMDPI
SCIESCOPUS
Impact of Various Pulse-Bases on Charge Boost in Ferroelectric Capacitors

Kim, Gwon; Lim, Jaehyuk; Eom, Deokjoon; Choi, Yejoo; Kim, Hyoungsub; Shin, Changhwan

ArticleIssue Date2022CitationIEEE ELECTRON DEVICE LETTERS, v.43, no.11, pp.1953 - 1956PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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STATISTICS
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