Bolotnikov, A. E.; Ackley, K.; Camarda, G. S.; Cui, Y.; Eger, J. F.; De Geronimo, G.; Finfrock, C.; Fried, J.; Hossain, A.; Lee, W., et al.
ArticleIssue Date2015CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.62, no.6, pp.3193 - 3198PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC