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Investigating the origin of efficiency droop by profiling the temperature across the multi-quantum well of an operating light-emitting diode

Jung, Euihan; Hwang, Gwangseok; Chung, Jaehun; Kwon, Ohmyoung; Han, Jaecheon; Moon, Yong-Tae; Seong, Tae-Yeon

ArticleIssue Date2015CitationAPPLIED PHYSICS LETTERS, v.106, no.4PublisherAMER INST PHYSICS
1
STATISTICS
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