Yoo, Myong-Jae; Cho, Hyun-Min; Kim, Seong-Hwan; Lim, Ho-Sun; Park, Seong-Dae; Lee, Woo-Sung; Kim, Jin-Seong; Seong, Tae-Geun; Jeong, Byoung-Jik; Nahm, Sahn
ArticleIssue Date2012CitationIEEE ELECTRON DEVICE LETTERS, v.33, no.11, pp 1607 - 1609PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC