Seo, Yujin; Lee, Tae In; Yoon, Chang Mo; Park, Bo-Eun; Hwang, Wan Sik; Kim, Hyungjun; Yu, Hyun-Yong; Cho, Byung Jin
ArticleIssue Date2017CitationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.8, pp.3303 - 3307PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC