Oh, Seungyeol; Kim, Taeho; Kwak, Myunghoon; Song, Jeonghwan; Woo, Jiyong; Jeon, Sanghun; Yoo, In Kyeong; Hwang, Hyunsang
ArticleIssue Date2017CitationIEEE ELECTRON DEVICE LETTERS, v.38, no.6, pp.732 - 735PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC