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HfZrOx-Based Ferroelectric Synapse Device With 32 Levels of Conductance States for Neuromorphic Applications

Authors
Oh, SeungyeolKim, TaehoKwak, MyunghoonSong, JeonghwanWoo, JiyongJeon, SanghunYoo, In KyeongHwang, Hyunsang
Issue Date
Jun-2017
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
HZO; multi-level; synapse device
Citation
IEEE ELECTRON DEVICE LETTERS, v.38, no.6, pp.732 - 735
Indexed
SCIE
SCOPUS
Journal Title
IEEE ELECTRON DEVICE LETTERS
Volume
38
Number
6
Start Page
732
End Page
735
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/83238
DOI
10.1109/LED.2017.2698083
ISSN
0741-3106
Abstract
We propose a HfZrOx (HZO)-based ferroelectric synapse device with multi-levels states of remnant polarization that is equivalent to multi-levels conductance states. By optimizing the pulse condition, we obtained 32 levels of remnant polarization states for both potentiation and depression. Furthermore, a ferroelectricfield-effect transistor is simulated using the obtained multiple remnant polarization states. The simulation results show that linear and symmetric conductance states can be obtained by applying optimum potentiation and depression pulse conditions. A neural network was simulated using the proposed devices for pattern recognition. Using synapse parameters of the HZO-based ferroelectric device and a neural network simulator, we have confirmed that the pattern recognition accuracy of the MNIST data set is 84%. It shows that the HZO-based synapse device has potential for future high-density neuromorphic systems.
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College of Science and Technology > Display Convergence in Division of Display and Semiconductor Physics > 1. Journal Articles

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