Kim, K. H.; Hwang, Seokjin; Fochuk, Petro; Nasi, L.; Zappettini, Andrea; Bolotnikov, A. E.; James, R. B.
ArticleIssue Date2016CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.63, no.4, pp.2278 - 2282PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC