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Degradation pattern of SnO2 nanowire field effect transistors

Na, Junhong; Huh, Junghwan; Park, Sung Chan; kim, DaeIl; Kim, Dong Wook; Lee, Jae Woo; Hwang, In-Sung; Lee, Jong-Heun; Ha, Jeong Sook; Kim, Gyu Tae

ArticleIssue Date2010CitationNANOTECHNOLOGY, v.21, no.48PublisherIOP PUBLISHING LTD
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