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A CONCURRENT APPROACH FOR FACILITY LAYOUT AND AMHS DESIGN IN SEMICONDUCTOR MANUFACTURING

Authors
Hong, DongphyoSeo, YoonhoXiao, Yujie
Issue Date
2014
Publisher
UNIV CINCINNATI INDUSTRIAL ENGINEERING
Keywords
Facility Layout; Bay Layout; AMHS Design; Concurrent Approach; Semiconductor Manufacturing
Citation
INTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE, v.21, no.4, pp.231 - 242
Indexed
SCIE
SCOPUS
Journal Title
INTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE
Volume
21
Number
4
Start Page
231
End Page
242
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/101092
ISSN
1072-4761
Abstract
This paper presents a concurrent approach to solve the design problem of facility layout and automated material handling system (AMHS) for semiconductor fabs. The layout is composed of bays which are unequal-area blocks with equal height but flexible width. In particular, the bay width and locations of a shortcut, bays, and their stockers, which are major fab design considerations, are concurrently determined in this problem. We developed a mixed integer programming (MIP) model for this problem to minimize the total travel distance (TTD) based on unidirectional inter-bay flow and a bidirectional shortcut. To solve large-sized problems, we developed a five-step heuristic algorithm to exploit and explore the solution space based on the MIP model. The computational results show that the proposed algorithm is able to find optimal solutions of small-sized problems and to solve large-sized problems within acceptable time.
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