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ITO/Ag/ITO multilayer-based transparent conductive electrodes for ultraviolet light-emitting diodes
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jae Hoon | - |
| dc.contributor.author | Woo, Kie Young | - |
| dc.contributor.author | Kim, Kyeong Heon | - |
| dc.contributor.author | Kim, Hee-Dong | - |
| dc.contributor.author | Kim, Tae Geun | - |
| dc.date.accessioned | 2021-09-05T18:08:17Z | - |
| dc.date.available | 2021-09-05T18:08:17Z | - |
| dc.date.created | 2021-06-15 | - |
| dc.date.issued | 2013-12-01 | - |
| dc.identifier.issn | 0146-9592 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/101340 | - |
| dc.description.abstract | ITO/Ag/ITO (IAI) multilayer-based transparent conductive electrodes for ultraviolet light-emitting diodes are fabricated by reactive sputtering, optimized by annealing, and characterized with respect to electrical and optical properties. Increasing the annealing temperature from 300 degrees C to 500 degrees C decreased the sheet resistance and increased the transmittance. This may result from an observed improvement in the crystallinity of the IAI multilayer and a reduction in the near-UV absorption coefficient of Ag. We observed the lowest sheet resistance (9.21 Omega/sq) and the highest optical transmittance (88%) at 380 nm for the IAI multilayer samples annealed in N-2 gas at 500 degrees C. (C) 2013 Optical Society of America | - |
| dc.language | English | - |
| dc.language.iso | en | - |
| dc.publisher | OPTICAL SOC AMER | - |
| dc.subject | OPTICAL-PROPERTIES | - |
| dc.subject | ITO | - |
| dc.subject | FILMS | - |
| dc.subject | GAN | - |
| dc.title | ITO/Ag/ITO multilayer-based transparent conductive electrodes for ultraviolet light-emitting diodes | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Kim, Tae Geun | - |
| dc.identifier.doi | 10.1364/OL.38.005055 | - |
| dc.identifier.scopusid | 2-s2.0-84889069767 | - |
| dc.identifier.wosid | 000327815100033 | - |
| dc.identifier.bibliographicCitation | OPTICS LETTERS, v.38, no.23, pp.5055 - 5058 | - |
| dc.relation.isPartOf | OPTICS LETTERS | - |
| dc.citation.title | OPTICS LETTERS | - |
| dc.citation.volume | 38 | - |
| dc.citation.number | 23 | - |
| dc.citation.startPage | 5055 | - |
| dc.citation.endPage | 5058 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Article | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Optics | - |
| dc.relation.journalWebOfScienceCategory | Optics | - |
| dc.subject.keywordPlus | OPTICAL-PROPERTIES | - |
| dc.subject.keywordPlus | ITO | - |
| dc.subject.keywordPlus | FILMS | - |
| dc.subject.keywordPlus | GAN | - |
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Related Researcher
- Kim, Tae geun
- College of Engineering (School of Electrical Engineering)