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Effect of moisture condensation on long-term reliability of crystalline silicon photovoltaic modules

Authors
Park, NochangHan, ChangwoonKim, Donghwan
Issue Date
12월-2013
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
MICROELECTRONICS RELIABILITY, v.53, no.12, pp.1922 - 1926
Indexed
SCIE
SCOPUS
Journal Title
MICROELECTRONICS RELIABILITY
Volume
53
Number
12
Start Page
1922
End Page
1926
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/101461
DOI
10.1016/j.microrel.2013.05.004
ISSN
0026-2714
Abstract
Moisture condensation (MC) can occur in photovoltaic (PV) modules in hot and humid climates, and the resulting water droplets can cause more areas of corrosion. Therefore, in this study, MC history of PV modules exposed to Miami climate (FL, USA) has been derived employing corresponding meteorological data. The duration of MC versus temperature of PV module (T-module) was calculated over I year. Furthermore, five types of accelerated tests were conducted to develop a MC-induced degradation prediction model. The thermal activation energy, 0.4524 eV, was calculated. The Brunauer-Emmett-Teller (BET) model was used to predict the degradation rate. The accumulated degradation rate of a PV module exposed to the accelerated condition of MC was 1.45 times greater than that of damp heat (DH). The effect of encapsulant materials on the frequency of MC and accumulated degradation rate over 1 year were calculated in the Miami climate. (C) 2013 Elsevier Ltd. All rights reserved.
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공과대학 (신소재공학부)
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