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Organic Field-Effect Transistor Memory Devices Using Discrete Ferritin Nanoparticle-Based Gate Dielectrics

Authors
Kim, Beom JoonKo, YongminCho, Jeong HoCho, Jinhan
Issue Date
25-Nov-2013
Publisher
WILEY-V C H VERLAG GMBH
Keywords
high-k dielectrics; memory devices; multilayers; organic field-effect transistors; proteins
Citation
SMALL, v.9, no.22, pp.3784 - 3791
Indexed
SCIE
SCOPUS
Journal Title
SMALL
Volume
9
Number
22
Start Page
3784
End Page
3791
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/101578
DOI
10.1002/smll.201300522
ISSN
1613-6810
Abstract
Organic field-effect transistor (OFET) memory devices made using highly stable iron-storage protein nanoparticle (NP) multilayers and pentacene semiconductor materials are introduced. These transistor memory devices have nonvolatile memory properties that cause reversible shifts in the threshold voltage (V-th) as a result of charge trapping and detrapping in the protein NP (i.e., the ferritin NP with a ferrihydrite phosphate core) gate dielectric layers rather than the metallic NP layers employed in conventional OFET memory devices. The protein NP-based OFET memory devices exhibit good programmable memory properties, namely, large memory window. V-th (greater than 20 V), a fast switching speed (10 mu s), high ON/OFF current ratio (above 10 4), and good electrical reliability. The memory performance of the devices is significantly enhanced by molecular-level manipulation of the protein NP layers, and various biomaterials with heme Fe-III/Fe-II redox couples similar to a ferrihydrite phosphate core are also employed as charge storage dielectrics. Furthermore, when these protein NP multilayers are deposited onto poly(ethylene naphthalate) substrates coated with an indium tin oxide gate electrode and a 50-nm-thick high-k Al2O3 gate dielectric layer, the approach is effectively extended to flexible protein transistor memory devices that have good electrical performance within a range of low operating voltages (<10 V) and reliable mechanical bending stability.
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