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Measurement of the wrong-sign decay D-0 -> K+pi(-)pi(+)pi(-)
- Authors
- White, E.; Schwartz, A. J.; Adachi, I.; Aihara, H.; Asner, D. M.; Aulchenko, V.; Aushev, T.; Bakich, A. M.; Bala, A.; Bhardwaj, V.; Bhuyan, B.; Bonvicini, G.; Bozek, A.; Bracko, M.; Brodzicka, J.; Browder, T. E.; Chekelian, V.; Chen, A.; Chen, P.; Cheon, B. G.; Chilikin, K.; Chistov, R.; Cho, I. -S.; Cho, K.; Chobanova, V.; Choi, Y.; Cinabro, D.; Dingfelder, J.; Dolezal, Z.; Drasal, Z.; Dutta, D.; Eidelman, S.; Epifanov, D.; Esen, S.; Farhat, H.; Fast, J. E.; Feindt, M.; Ferber, T.; Frey, A.; Gaur, V.; Gabyshev, N.; Ganguly, S.; Gillard, R.; Goh, Y. M.; Golob, B.; Hara, T.; Hayasaka, K.; Hayashii, H.; Hoshi, Y.; Hou, W. -S.; Hsiung, Y. B.; Hyun, H. J.; Iijima, T.; Ishikawa, A.; Itoh, R.; Iwasaki, Y.; Iwashita, T.; Jaegle, I.; Julius, T.; Kah, D. H.; Kang, J. H.; Kato, E.; Kiesling, C.; Kim, D. Y.; Kim, H. O.; Kim, J. B.; Kim, J. H.; Kim, M. J.; Kim, Y. J.; Kinoshita, K.; Klucar, J.; Ko, B. R.; Kodys, P.; Korpar, S.; Krizan, P.; Krokovny, P.; Kronenbitter, B.; Kuhr, T.; Kumita, T.; Kuzmin, A.; Kwon, Y. -J.; Lange, J. S.; Lee, S. -H.; Li, J.; Li, Y.; Gioi, L. Li; Libby, J.; Liu, C.; Liu, Y.; Liventsev, D.; Lukin, P.; Matvienko, D.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Moll, A.; Mussa, R.; Nakano, E.; Nakao, M.; Natkaniec, Z.; Nayak, M.; Nedelkovska, E.; Ng, C.; Nisar, N. K.; Nishida, S.; Nitoh, O.; Ogawa, S.; Okuno, S.; Oswald, C.; Pakhlov, P.; Pakhlova, G.; Park, H.; Park, H. K.; Pedlar, T. K.; Pestotnik, R.; Petric, M.; Piilonen, L. E.; Ritter, M.; Roehrken, M.; Rostomyan, A.; Ryu, S.; Sahoo, H.; Saito, T.; Sakai, Y.; Sandilya, S.; Santelj, L.; Sanuki, T.; Sato, Y.; Savinov, V.; Schneider, O.; Schnell, G.; Schwanda, C.; Semmler, D.; Senyo, K.; Seon, O.; Sevior, M. E.; Shapkin, M.; Shibata, T. -A.; Shiu, J. -G.; Shwartz, B.; Sibidanov, A.; Sohn, Y. -S.; Sokolov, A.; Solovieva, E.; Stanic, S.; Staric, M.; Steder, M.; Sumiyoshi, T.; Tamponi, U.; Tatishvili, G.; Teramoto, Y.; Uchida, M.; Uehara, S.; Unno, Y.; Uno, S.; Vahsen, S. E.; Van Hulse, C.; Varner, G.; Vorobyev, V.; Wagner, M. N.; Wang, C. H.; Wang, M. -Z.; Wang, P.; Watanabe, Y.; Williams, K. M.; Won, E.; Yamashita, Y.; Yashchenko, S.; Yusa, Y.; Zhang, Z. P.; Zhilich, V.; Zhulanov, V.; Zupanc, A.
- Issue Date
- 30-Sep-2013
- Publisher
- AMER PHYSICAL SOC
- Citation
- PHYSICAL REVIEW D, v.88, no.5
- Indexed
- SCOPUS
- Journal Title
- PHYSICAL REVIEW D
- Volume
- 88
- Number
- 5
- ISSN
- 2470-0010
- Abstract
- A measurement of the rate for the "wrong-sign" decay D-0 -> K+pi(-)pi(+)pi(-) relative to that for the "right-sign" decay D-0 -> K-pi(+)pi(+)pi(-) is presented. Using 791 fb(-1) of data collected with the Belle detector, we obtain a branching fraction ratio of R-WS = [0.324 +/- 0.008(stat) +/- 0.007(sys)]%. Multiplying this ratio by the world average value for the branching fraction B(D-0 -> K-pi(+)pi(+)pi(-)) gives a branching fraction B(D-0 -> K+pi(-)pi(+)pi(-)) = (2.61 +/- 0.06(-0.008)(+0.09)) x 10(-4).
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Related Researcher
- Won, Eun il
- College of Science (Department of Physics)