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Quantification of Ridging in Ferritic Stainless Steel Sheets by Electron Backscattered Diffraction R-Value Maps

Authors
Lee, Kye-ManPark, JieonKim, SangseokPark, SoohoHuh, Moo-Young
Issue Date
8월-2013
Publisher
CAMBRIDGE UNIV PRESS
Keywords
EBSD property map; R-value map; microtexture; ridging; Lankford parameter; ferritic stainless steel
Citation
MICROSCOPY AND MICROANALYSIS, v.19, pp.17 - 20
Indexed
SCIE
SCOPUS
Journal Title
MICROSCOPY AND MICROANALYSIS
Volume
19
Start Page
17
End Page
20
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/102627
DOI
10.1017/S1431927613012245
ISSN
1431-9276
Abstract
In ferritic stainless steel (FSS), undesirable surface defects of ridging appear during deep drawing. The formation of these defects is attributed to the inhomogeneous distribution of orientations of individual grains. In the present work, a new electron backscattered diffraction R(alpha)-value map was introduced, and the dependence of the tensile directions on the formation of ridging in an FSS sheet was discussed using this map. The results showed that large grain colonies in the R(alpha)-value maps lead to the formation of severe ridging in an FSS sheet.
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