Quantification of Ridging in Ferritic Stainless Steel Sheets by Electron Backscattered Diffraction R-Value Maps
- Authors
- Lee, Kye-Man; Park, Jieon; Kim, Sangseok; Park, Sooho; Huh, Moo-Young
- Issue Date
- 8월-2013
- Publisher
- CAMBRIDGE UNIV PRESS
- Keywords
- EBSD property map; R-value map; microtexture; ridging; Lankford parameter; ferritic stainless steel
- Citation
- MICROSCOPY AND MICROANALYSIS, v.19, pp.17 - 20
- Indexed
- SCIE
SCOPUS
- Journal Title
- MICROSCOPY AND MICROANALYSIS
- Volume
- 19
- Start Page
- 17
- End Page
- 20
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/102627
- DOI
- 10.1017/S1431927613012245
- ISSN
- 1431-9276
- Abstract
- In ferritic stainless steel (FSS), undesirable surface defects of ridging appear during deep drawing. The formation of these defects is attributed to the inhomogeneous distribution of orientations of individual grains. In the present work, a new electron backscattered diffraction R(alpha)-value map was introduced, and the dependence of the tensile directions on the formation of ridging in an FSS sheet was discussed using this map. The results showed that large grain colonies in the R(alpha)-value maps lead to the formation of severe ridging in an FSS sheet.
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Collections - College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles
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