Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Phase noise calculation and variability analysis of RFCMOS LC oscillator based on physics-based mixed-mode simulation

Full metadata record
DC Field Value Language
dc.contributor.authorHong, Sung-Min-
dc.contributor.authorOh, Yongho-
dc.contributor.authorKim, Namhyung-
dc.contributor.authorRieh, Jae-Sung-
dc.date.accessioned2021-09-06T05:45:26Z-
dc.date.available2021-09-06T05:45:26Z-
dc.date.created2021-06-14-
dc.date.issued2013-01-
dc.identifier.issn0038-1101-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/104332-
dc.description.abstractA mixed-mode technology computer-aided design framework, which can evaluate the periodic steady-state solution of the oscillator efficiently, has been applied to an RFCMOS LC oscillator. Physics-based simulation of active devices makes it possible to link the internal parameters inside the devices and the performance of the oscillator directly. The phase noise of the oscillator is simulated with physics-based device simulation and the results are compared with the experimental data. Moreover, the statistical effect of the random dopant fluctuation on the oscillation frequency is investigated. (C) 2012 Elsevier Ltd. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.subjectDEVICE SIMULATION-
dc.subjectCIRCUIT-
dc.subjectALGORITHMS-
dc.subjectSPECTRUM-
dc.titlePhase noise calculation and variability analysis of RFCMOS LC oscillator based on physics-based mixed-mode simulation-
dc.typeArticle-
dc.contributor.affiliatedAuthorRieh, Jae-Sung-
dc.identifier.doi10.1016/j.sse.2012.07.022-
dc.identifier.scopusid2-s2.0-84869499784-
dc.identifier.wosid000313611000030-
dc.identifier.bibliographicCitationSOLID-STATE ELECTRONICS, v.79, pp.152 - 158-
dc.relation.isPartOfSOLID-STATE ELECTRONICS-
dc.citation.titleSOLID-STATE ELECTRONICS-
dc.citation.volume79-
dc.citation.startPage152-
dc.citation.endPage158-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusDEVICE SIMULATION-
dc.subject.keywordPlusCIRCUIT-
dc.subject.keywordPlusALGORITHMS-
dc.subject.keywordPlusSPECTRUM-
dc.subject.keywordAuthorOscillator-
dc.subject.keywordAuthorPhase noise-
dc.subject.keywordAuthorSemiconductor device modeling-
dc.subject.keywordAuthorSemiconductor device noise-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Rieh, Jae Sung photo

Rieh, Jae Sung
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE