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Investigation of ultraviolet optical properties of semiconducting-enriched and metal-enriched single-walled carbon nanotube networks using spectroscopic ellipsometry

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dc.contributor.authorPark, Young Ran-
dc.contributor.authorKim, Woo-Jae-
dc.contributor.authorKo, Min Jae-
dc.contributor.authorMin, Nam Ki-
dc.contributor.authorLee, Cheol Jin-
dc.date.accessioned2021-09-06T10:49:34Z-
dc.date.available2021-09-06T10:49:34Z-
dc.date.created2021-06-19-
dc.date.issued2012-
dc.identifier.issn2040-3364-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/106256-
dc.description.abstractThe ultraviolet optical properties of semiconducting-enriched and metallic-enriched single-walled carbon nanotube (semi-enriched and m-enriched SWCNT) networks were studied using spectroscopic ellipsometry. According to calculated energy loss function, the energy loss peak assigned to the maximum intensity of p-plasmon energy was found to increase from 4.5 eV to 5.0 eV as SWCNT network composition was changed from m-SWCNT enriched to semi-SWCNT enriched. These results clearly demonstrate that the dielectric response in the 4-6 eV range is sensitive to changes in the surrounding dielectric environment depending on the semi-/m-SWCNT content. Therefore, the spectral shift of this energy loss is attributed to the enhanced electron confinement by the presence of the surface plasmon due to a small amount of m-SWCNT, which is an important phenomenon at the SWCNT network.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherROYAL SOC CHEMISTRY-
dc.subjectELECTRONIC-STRUCTURE-
dc.subjectSEPARATION-
dc.titleInvestigation of ultraviolet optical properties of semiconducting-enriched and metal-enriched single-walled carbon nanotube networks using spectroscopic ellipsometry-
dc.typeArticle-
dc.contributor.affiliatedAuthorPark, Young Ran-
dc.contributor.affiliatedAuthorKo, Min Jae-
dc.contributor.affiliatedAuthorMin, Nam Ki-
dc.contributor.affiliatedAuthorLee, Cheol Jin-
dc.identifier.doi10.1039/c2nr31205k-
dc.identifier.scopusid2-s2.0-84866974487-
dc.identifier.wosid000310976800053-
dc.identifier.bibliographicCitationNANOSCALE, v.4, no.20, pp.6532 - 6536-
dc.relation.isPartOfNANOSCALE-
dc.citation.titleNANOSCALE-
dc.citation.volume4-
dc.citation.number20-
dc.citation.startPage6532-
dc.citation.endPage6536-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusELECTRONIC-STRUCTURE-
dc.subject.keywordPlusSEPARATION-
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Graduate School > KU-KIST Graduate School of Converging Science and Technology > 1. Journal Articles
College of Science and Technology > Department of Electro-Mechanical Systems Engineering > 1. Journal Articles
College of Engineering > School of Electrical Engineering > 1. Journal Articles

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