Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

A Study on the Scalability of a Selector Device Using Threshold Switching in Pt/GeSe/Pt

Authors
Ahn, Hyung-WooJeong, Doo SeokCheong, Byung-kiKim, Su-dongShin, Sang-YeolLim, HyungkwangKim, DonghwanLee, Suyoun
Issue Date
2013
Publisher
ELECTROCHEMICAL SOC INC
Citation
ECS SOLID STATE LETTERS, v.2, no.9, pp.N31 - N33
Indexed
SCIE
SCOPUS
Journal Title
ECS SOLID STATE LETTERS
Volume
2
Number
9
Start Page
N31
End Page
N33
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/106459
DOI
10.1149/2.011309ssl
ISSN
2162-8742
Abstract
We performed a study on the scalability of Ovonic Threshold Switching (OTS) devices using an amorphous chalcogenide material, Ge0.4Se0.6. As the cell size decreased, the maximum driving current was estimated to be over 3 x 10(7) Lambda/cm(2), surpassing the state of the art devices based on crystalline Si. However, the threshold voltage (V-TH), the holding voltage (V-H), and the holding current (I-H) were observed to increase laying challenges to be resolved for developing non-destructive and low-power consuming selector devices. V-TH was found to be reduced by decreasing the thickness of GeSe film until 40 nm, below which it started to saturate. This might be associated with the Schottky barrier formed at the interface between the amorphous semiconductor and the metal electrode. (c) 2013 The Electrochemical Society. All rights reserved.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher KIM, Dong hwan photo

KIM, Dong hwan
공과대학 (신소재공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE