Flexible Nano-Floating-Gate Memory With Channels of Enhancement-Mode Si Nanowires
DC Field | Value | Language |
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dc.contributor.author | Jeon, Youngin | - |
dc.contributor.author | Lee, Myeongwon | - |
dc.contributor.author | Moon, Taeho | - |
dc.contributor.author | Kim, Sangsig | - |
dc.date.accessioned | 2021-09-06T13:57:35Z | - |
dc.date.available | 2021-09-06T13:57:35Z | - |
dc.date.created | 2021-06-14 | - |
dc.date.issued | 2012-11 | - |
dc.identifier.issn | 0018-9383 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/107113 | - |
dc.description.abstract | The electrical characteristics of a flexible nano-floating-gate memory (NFGM) device with a channel made of an enhancement-mode n(+)-p-n(+) Si nanowire (Si-NW) are investigated in this work. The NFGM based on the enhancement-mode Si-NW field-effect transistor is constructed on a plastic substrate with a Pt-nanocrystal floating-gate layer; it exhibits an ON-current/OFF-current ratio of similar to 10(7) and a subthreshold swing of 88 mV/dec. The NFGM shows good memory characteristics and mechanical flexibility, such as a threshold voltage shift of 1.85 V, a retention time of up to similar to 10(4) s, and a stability for up to 1000 bending cycles. The present study demonstrates the promising potential of flexible Si-NW-based nonvolatile memories for future electronics. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject | METAL NANOCRYSTAL MEMORIES | - |
dc.subject | FIELD-EFFECT TRANSISTORS | - |
dc.subject | ELECTRONICS | - |
dc.subject | PHOTONICS | - |
dc.title | Flexible Nano-Floating-Gate Memory With Channels of Enhancement-Mode Si Nanowires | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Sangsig | - |
dc.identifier.doi | 10.1109/TED.2012.2211879 | - |
dc.identifier.scopusid | 2-s2.0-84867900822 | - |
dc.identifier.wosid | 000310385100011 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v.59, no.11, pp.2939 - 2942 | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.citation.title | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.citation.volume | 59 | - |
dc.citation.number | 11 | - |
dc.citation.startPage | 2939 | - |
dc.citation.endPage | 2942 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | METAL NANOCRYSTAL MEMORIES | - |
dc.subject.keywordPlus | FIELD-EFFECT TRANSISTORS | - |
dc.subject.keywordPlus | ELECTRONICS | - |
dc.subject.keywordPlus | PHOTONICS | - |
dc.subject.keywordAuthor | Field-effect transistor (FET) | - |
dc.subject.keywordAuthor | memory | - |
dc.subject.keywordAuthor | nanocrystal (NC) | - |
dc.subject.keywordAuthor | nonvolatile | - |
dc.subject.keywordAuthor | plastic substrate | - |
dc.subject.keywordAuthor | Pt | - |
dc.subject.keywordAuthor | silicon-nanowire (Si-NW) array | - |
dc.subject.keywordAuthor | top-down approach | - |
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