Application of nanosphere lithography to charge trap flash memories with patterned Si3N4 trap layers
DC Field | Value | Language |
---|---|---|
dc.contributor.author | An, Ho-Myoung | - |
dc.contributor.author | Kim, Hee-Dong | - |
dc.contributor.author | You, Hee-Wook | - |
dc.contributor.author | Kim, Kyeong Heon | - |
dc.contributor.author | Sung, Yun Mo | - |
dc.contributor.author | Cho, Won-Ju | - |
dc.contributor.author | Kim, Tae Geun | - |
dc.date.accessioned | 2021-09-06T14:55:16Z | - |
dc.date.available | 2021-09-06T14:55:16Z | - |
dc.date.created | 2021-06-15 | - |
dc.date.issued | 2012-10 | - |
dc.identifier.issn | 0167-9317 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/107308 | - |
dc.description.abstract | In this paper, nanosphere lithography (NSL) is applied to the surface of the Si3N4 trap layer in the charge trap flash device to improve its memory characteristics. A 500-nm-diameter polystyrene bead array was used as a mask to make patterns on the surface of the Si3N4 trap layer during etching processes using CF4 gases. The pattern depth measured by atomic force microscope was about 4 nm. The metal-aluminum oxide-nitride-oxide-silicon capacitor that has a patterned surface shows a larger capacitance-voltage memory window of 5 V, higher tunneling current at bias voltages higher than 10 V. and faster program speeds of 50 ms, as compared to those measured from the capacitor with the flat surface. These results are thought to be due to abundant memory traps available at the interface between the nitride and top oxide formed by NSL. (C) 2012 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER | - |
dc.subject | FABRICATION | - |
dc.subject | GRAPHENE | - |
dc.subject | OXIDE | - |
dc.title | Application of nanosphere lithography to charge trap flash memories with patterned Si3N4 trap layers | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Sung, Yun Mo | - |
dc.contributor.affiliatedAuthor | Kim, Tae Geun | - |
dc.identifier.doi | 10.1016/j.mee.2012.07.061 | - |
dc.identifier.wosid | 000309497200076 | - |
dc.identifier.bibliographicCitation | MICROELECTRONIC ENGINEERING, v.98, pp.347 - 350 | - |
dc.relation.isPartOf | MICROELECTRONIC ENGINEERING | - |
dc.citation.title | MICROELECTRONIC ENGINEERING | - |
dc.citation.volume | 98 | - |
dc.citation.startPage | 347 | - |
dc.citation.endPage | 350 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | FABRICATION | - |
dc.subject.keywordPlus | GRAPHENE | - |
dc.subject.keywordPlus | OXIDE | - |
dc.subject.keywordAuthor | Charge trap flash | - |
dc.subject.keywordAuthor | SONOS | - |
dc.subject.keywordAuthor | Nanosphere lithography | - |
dc.subject.keywordAuthor | Memory-trap density | - |
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