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The work function of doped polyaniline nanoparticles observed by Kelvin probe force microscopy

Authors
Park, JinsungBang, DoyeonJang, KuewhanHaam, SeungjooYang, JaemoonNa, Sungsoo
Issue Date
14-9월-2012
Publisher
IOP PUBLISHING LTD
Citation
NANOTECHNOLOGY, v.23, no.36
Indexed
SCIE
SCOPUS
Journal Title
NANOTECHNOLOGY
Volume
23
Number
36
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/107461
DOI
10.1088/0957-4484/23/36/365705
ISSN
0957-4484
Abstract
The work function of polyaniline nanoparticles in the emeraldine base state was determined by Kelvin probe force microscopy to be similar to 270 meV higher than that of similar nanoparticles in the emeraldine salt state. Normal tapping mode atomic force microscopy could not be used to distinguish between the particles due to their similar morphologies and sizes. Moreover, other potential measurement systems, such as using zeta potentials, were not suitable for the measurement of surface charges of doped nanoparticles due to their encapsulation by interfering chemical groups. Kelvin probe force microscopy can be used to overcome these limitations and unambiguously distinguish between the bare and doped polyaniline nanoparticles.
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