Effect of post-fabrication thermal annealing on Fermi-level pinning phenomenon in metal-pentacene junctions
DC Field | Value | Language |
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dc.contributor.author | Jeong, Seong-Guk | - |
dc.contributor.author | Park, Hyung-Youl | - |
dc.contributor.author | Lim, Myung-Hoon | - |
dc.contributor.author | Jung, Woo-Shik | - |
dc.contributor.author | Yu, Hyun-Yong | - |
dc.contributor.author | Roh, Yonghan | - |
dc.contributor.author | Park, Jin-Hong | - |
dc.date.accessioned | 2021-09-06T15:50:46Z | - |
dc.date.available | 2021-09-06T15:50:46Z | - |
dc.date.created | 2021-06-18 | - |
dc.date.issued | 2012-09 | - |
dc.identifier.issn | 1566-1199 | - |
dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/107493 | - |
dc.description.abstract | In this work, we investigated the material properties of pentacene films with XRD and AFM analyses as it were annealed from 25 to 150 degrees C in N-2 ambient. Electrical characterization of the films was also performed by transfer length method (TLM) at each temperature. These results were then correlated with the Fermi level pinning phenomenon in Al- and Ti-pentacene junctions. For both junctions, it was found that as the surface quality of the pentacene films changed with increase in annealing temperature, the hole-barrier heights (h-BH) that were modulated by Fermi level pinning were effectively reduced. (C) 2012 Elsevier B. V. All rights reserved. | - |
dc.language | English | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | THIN-FILM TRANSISTORS | - |
dc.subject | FIELD-EFFECT TRANSISTORS | - |
dc.subject | TEMPERATURE | - |
dc.subject | MORPHOLOGY | - |
dc.subject | INJECTION | - |
dc.subject | CONTACT | - |
dc.title | Effect of post-fabrication thermal annealing on Fermi-level pinning phenomenon in metal-pentacene junctions | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Yu, Hyun-Yong | - |
dc.identifier.doi | 10.1016/j.orgel.2012.05.030 | - |
dc.identifier.scopusid | 2-s2.0-84861674973 | - |
dc.identifier.wosid | 000306107200004 | - |
dc.identifier.bibliographicCitation | ORGANIC ELECTRONICS, v.13, no.9, pp.1511 - 1515 | - |
dc.relation.isPartOf | ORGANIC ELECTRONICS | - |
dc.citation.title | ORGANIC ELECTRONICS | - |
dc.citation.volume | 13 | - |
dc.citation.number | 9 | - |
dc.citation.startPage | 1511 | - |
dc.citation.endPage | 1515 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | THIN-FILM TRANSISTORS | - |
dc.subject.keywordPlus | FIELD-EFFECT TRANSISTORS | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | MORPHOLOGY | - |
dc.subject.keywordPlus | INJECTION | - |
dc.subject.keywordPlus | CONTACT | - |
dc.subject.keywordAuthor | Pentacene | - |
dc.subject.keywordAuthor | Fermi-level pinning | - |
dc.subject.keywordAuthor | Metal-pentacene | - |
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