Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Switching Characterization and Failure Analysis of In2Se3 Based Phase Change Memory (vol 44, 4759, 2005)
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Heon | - |
| dc.contributor.author | Kang, Dae-Hwan | - |
| dc.date.accessioned | 2021-09-06T17:29:06Z | - |
| dc.date.available | 2021-09-06T17:29:06Z | - |
| dc.date.created | 2021-06-18 | - |
| dc.date.issued | 2012-08 | - |
| dc.identifier.issn | 0021-4922 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/107889 | - |
| dc.language | English | - |
| dc.language.iso | en | - |
| dc.publisher | JAPAN SOC APPLIED PHYSICS | - |
| dc.title | Switching Characterization and Failure Analysis of In2Se3 Based Phase Change Memory (vol 44, 4759, 2005) | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Lee, Heon | - |
| dc.identifier.doi | 10.1143/JJAP.51.089201 | - |
| dc.identifier.scopusid | 2-s2.0-84864655631 | - |
| dc.identifier.wosid | 000307992700059 | - |
| dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS, v.51, no.8 | - |
| dc.relation.isPartOf | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
| dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS | - |
| dc.citation.volume | 51 | - |
| dc.citation.number | 8 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Correction | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.