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Switching Characterization and Failure Analysis of In2Se3 Based Phase Change Memory (vol 44, 4759, 2005)
- Authors
- Lee, Heon; Kang, Dae-Hwan
- Issue Date
- 8월-2012
- Publisher
- JAPAN SOC APPLIED PHYSICS
- Citation
- JAPANESE JOURNAL OF APPLIED PHYSICS, v.51, no.8
- Indexed
- SCIE
SCOPUS
- Journal Title
- JAPANESE JOURNAL OF APPLIED PHYSICS
- Volume
- 51
- Number
- 8
- ISSN
- 0021-4922
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- There are no files associated with this item.
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