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PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration

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dc.contributor.authorKim, Moo-Young-
dc.contributor.authorLee, Hokyu-
dc.contributor.authorKim, Chulwoo-
dc.date.accessioned2021-09-06T21:54:11Z-
dc.date.available2021-09-06T21:54:11Z-
dc.date.created2021-06-18-
dc.date.issued2012-04-
dc.identifier.issn1063-8210-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/108880-
dc.description.abstractA current source with a small current error has been proposed to maintain the bandwidth of the system without an increase in power consumption for a margin. It minimizes the current error under process, supply voltage, and temperature (PVT) variations. Because the on-resistance of the nMOS array is self-calibrated digitally by an on-chip digital PVT detector, a current error of only +/- 2% is achieved. The current source has been implemented in an 80-nm CMOS process, occupies 0.018 mm(2) and consumes 94.9 mu W at a supply voltage of 1.0 V.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectRESISTANCE-
dc.titlePVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Chulwoo-
dc.identifier.doi10.1109/TVLSI.2011.2109971-
dc.identifier.scopusid2-s2.0-84858997296-
dc.identifier.wosid000302085300014-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.20, no.4, pp.737 - 741-
dc.relation.isPartOfIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS-
dc.citation.titleIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS-
dc.citation.volume20-
dc.citation.number4-
dc.citation.startPage737-
dc.citation.endPage741-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryComputer Science, Hardware & Architecture-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusRESISTANCE-
dc.subject.keywordAuthorAll digital gates-
dc.subject.keywordAuthorcurrent source-
dc.subject.keywordAuthoron-chip-
dc.subject.keywordAuthorprocess, supply voltage, and temperature (PVT) detector-
dc.subject.keywordAuthorself-calibration-
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