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Significance of irreversible formation of "electromer'' in 1-bis[4-[N,N-di(4-tolyl)amino]phenyl]-cyclohexane layer associated with the stability of deep blue phosphorescent organic light emitting diodes

Authors
Kwon, SoonnamWee, Kyung-RyangPac, ChyongjinKang, Sang Ook
Issue Date
4월-2012
Publisher
ELSEVIER SCIENCE BV
Keywords
Electromer; Defect sites; Stability; Deep blue PHOLED
Citation
ORGANIC ELECTRONICS, v.13, no.4, pp.645 - 651
Indexed
SCIE
SCOPUS
Journal Title
ORGANIC ELECTRONICS
Volume
13
Number
4
Start Page
645
End Page
651
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/108898
DOI
10.1016/j.orgel.2011.12.022
ISSN
1566-1199
Abstract
We demonstrate that injection of electrons in 1-bis[4-[N,N-di(4-tolyl)amino]phenyl]-cyclohexane (TAPC) layer irreversibly induces defect sites responsible for "electromer'' emission. We also show that the defects alter the charge transporting properties of TAPC layer to influence the charge balance of iridium(III)[bis(4,6-difluorophenyl)pyridinato-N,C-2 ']tetrakis(1-pyrazolyl)borate (FIr6) based deep blue phosphorescent organic light emitting diodes (PHOLED). The present investigation implies that deep-blue PHOLEDs should be carefully designed for the emission zone to be located far enough from the TAPC layer so as to avoid or minimize the emission from TAPC layer. (c) 2012 Elsevier B.V. All rights reserved.
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