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New approaches for micro-controlling of oxygen dopant contents in silicon-based thin films with application to multi-band gap solar cells

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dc.contributor.authorSo, HyunWook-
dc.contributor.authorJang, JinNyoung-
dc.contributor.authorLee, DongHyeok-
dc.contributor.authorHong, MunPyo-
dc.date.accessioned2021-09-06T23:57:05Z-
dc.date.available2021-09-06T23:57:05Z-
dc.date.created2021-06-18-
dc.date.issued2012-
dc.identifier.issn1567-1739-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/109331-
dc.description.abstractUsing the neutral-beam-assisted chemical vapor deposition (NBaCVD) system [5-12], an alternative technique that can control the oxygen doping in a silicon-based thin film has been developed. This brand-new technique has the ability to controlling of optical band gaps by micro-control the oxygen dopant concentrates in the nc-Si thin films. This control of the oxygen doping results in self-biasing on the internal antenna of an inductively coupled plasma (ICP) source; it also results in the hydrogen neutral beam (NB) energy being adjusted by the reflector bias. The oxygen atoms are supplied from the sputtering of an internal ICP antenna covered by a quartz tube and are eliminated by the energetic hydrogen NB in the NBaCVD system, rather than by a mass-flow-controller (MFC) used in conventional CVD. These results are observed via Fourier Transform Infrared Spectroscopy, X-ray Photoelectron Spectroscopy, Secondary Ion Mass Spectroscopy and UV-visible data. The result of this experiment allows the fabrication of multi-junction solar cells with gradually varying optical band gaps. (c) 2012 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectCHEMICAL-VAPOR-DEPOSITION-
dc.subjectINDUCTIVELY-COUPLED PLASMA-
dc.subjectPARTICLE-BEAM-
dc.subjectMETAL-SURFACES-
dc.subjectBACKPLANE-
dc.subjectIONS-
dc.titleNew approaches for micro-controlling of oxygen dopant contents in silicon-based thin films with application to multi-band gap solar cells-
dc.typeArticle-
dc.contributor.affiliatedAuthorHong, MunPyo-
dc.identifier.doi10.1016/j.cap.2012.05.023-
dc.identifier.wosid000316215400015-
dc.identifier.bibliographicCitationCURRENT APPLIED PHYSICS, v.12, pp.S64 - S70-
dc.relation.isPartOfCURRENT APPLIED PHYSICS-
dc.citation.titleCURRENT APPLIED PHYSICS-
dc.citation.volume12-
dc.citation.startPageS64-
dc.citation.endPageS70-
dc.type.rimsART-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusCHEMICAL-VAPOR-DEPOSITION-
dc.subject.keywordPlusINDUCTIVELY-COUPLED PLASMA-
dc.subject.keywordPlusPARTICLE-BEAM-
dc.subject.keywordPlusMETAL-SURFACES-
dc.subject.keywordPlusBACKPLANE-
dc.subject.keywordPlusIONS-
dc.subject.keywordAuthorNBaCVD-
dc.subject.keywordAuthorNanocrystalline silicon-
dc.subject.keywordAuthorOxygen doping-
dc.subject.keywordAuthorTermination capacitor-
dc.subject.keywordAuthorNeutral beam-
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