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Design of vertical type probe tip using finite element analysis
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Oh, Y.R. | - |
| dc.contributor.author | Kim, Y.J. | - |
| dc.contributor.author | Nam, H.S. | - |
| dc.contributor.author | Park, U.G. | - |
| dc.contributor.author | Lee, H.J. | - |
| dc.contributor.author | Kim, J.Y. | - |
| dc.contributor.author | Park, J.H. | - |
| dc.date.accessioned | 2021-09-07T04:04:39Z | - |
| dc.date.available | 2021-09-07T04:04:39Z | - |
| dc.date.created | 2021-06-17 | - |
| dc.date.issued | 2012 | - |
| dc.identifier.issn | 1226-4873 | - |
| dc.identifier.uri | https://scholar.korea.ac.kr/handle/2021.sw.korea/110617 | - |
| dc.description.abstract | The design process of a micro-probe tip is very complicated and expensive. To avoid these problems, in this study, we used element (FE) analysis. To simplify design process . A new pre-probe tip (cobra-needle type) made of Ni and Co was designed by FE analysis. Experimental results were compared with those obtained by FE analysis to verify the reliability of the analysis. The contact force and over drive were respectively found to be 12.5 gf(Contact Force) and 100 μm(Over drive). We propose the new designed probe tip. Material of new designed probe tip is NiCo. Values of Property are 1̃2 gf(Contact Force) and 100 μμm(Over drive). © 2012 The Korean Society of Mechanical Engineers. | - |
| dc.language | Korean | - |
| dc.language.iso | ko | - |
| dc.publisher | Korean Society of Mechanical Engineers | - |
| dc.subject | Mechanical engineering | - |
| dc.subject | Technology | - |
| dc.subject | Contact forces | - |
| dc.subject | Design process | - |
| dc.subject | FE analysis | - |
| dc.subject | MEMS process | - |
| dc.subject | Micro-probes | - |
| dc.subject | Probe tests | - |
| dc.subject | Probe tips | - |
| dc.subject | Vertical-type | - |
| dc.subject | Reliability analysis | - |
| dc.title | Design of vertical type probe tip using finite element analysis | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Kim, Y.J. | - |
| dc.identifier.doi | 10.3795/KSME-A.2012.36.8.851 | - |
| dc.identifier.scopusid | 2-s2.0-84898422461 | - |
| dc.identifier.bibliographicCitation | Transactions of the Korean Society of Mechanical Engineers, A, v.36, no.8, pp.851 - 856 | - |
| dc.relation.isPartOf | Transactions of the Korean Society of Mechanical Engineers, A | - |
| dc.citation.title | Transactions of the Korean Society of Mechanical Engineers, A | - |
| dc.citation.volume | 36 | - |
| dc.citation.number | 8 | - |
| dc.citation.startPage | 851 | - |
| dc.citation.endPage | 856 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Article | - |
| dc.identifier.kciid | ART001683143 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.description.journalRegisteredClass | kci | - |
| dc.subject.keywordPlus | Mechanical engineering | - |
| dc.subject.keywordPlus | Technology | - |
| dc.subject.keywordPlus | Contact forces | - |
| dc.subject.keywordPlus | Design process | - |
| dc.subject.keywordPlus | FE analysis | - |
| dc.subject.keywordPlus | MEMS process | - |
| dc.subject.keywordPlus | Micro-probes | - |
| dc.subject.keywordPlus | Probe tests | - |
| dc.subject.keywordPlus | Probe tips | - |
| dc.subject.keywordPlus | Vertical-type | - |
| dc.subject.keywordPlus | Reliability analysis | - |
| dc.subject.keywordAuthor | FE analysis | - |
| dc.subject.keywordAuthor | MEMS process | - |
| dc.subject.keywordAuthor | Probe test | - |
| dc.subject.keywordAuthor | Probe tip | - |
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