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Nanostructured n-ZnO/thin film p-silicon heterojunction light-emitting diodes

Authors
Ahn, JaehuiPark, HyunikMastro, Michael A.Hite, Jennifer K.Eddy, Charles R., Jr.Kim, Jihyun
Issue Date
19-12월-2011
Publisher
OPTICAL SOC AMER
Citation
OPTICS EXPRESS, v.19, no.27, pp.26006 - 26010
Indexed
SCIE
SCOPUS
Journal Title
OPTICS EXPRESS
Volume
19
Number
27
Start Page
26006
End Page
26010
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/110899
DOI
10.1364/OE.19.026006
ISSN
1094-4087
Abstract
Electroluminescence (EL) was obtained from a p-Si (100) thin film / nanostructured n-ZnO heterojunction diode fabricated by a simple dielectrophoresis (DEP) method. The Si substrate was pre-patterned with electrodes and an insulating separation layer by a standard photolithographic process. ZnO nanostructures were formed by a simple solution chemistry and subsequently transferred to the pre-patterned substrate. Application of the DEP force at a frequency of 100 kHz and 6 V peak-to-peak voltage allowed precise positioning of the ZnO nanostructures at the edge of the metal electrodes. The physically formed p-Si (100) thin film/ nanostructured n-ZnO heterojunction displayed multi-color emission from the ZnO near band edge as well as emission from defective states within the ZnO band gap. (C) 2011 Optical Society of America
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