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Improved Light Output of GaN-Based Light-Emitting Diodes by Using AgNi Reflective Contacts

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dc.contributor.authorJung, Se-Yeon-
dc.contributor.authorLee, Sang Youl-
dc.contributor.authorSong, June-O-
dc.contributor.authorJin, Sungho-
dc.contributor.authorSeong, Tae-Yeon-
dc.date.accessioned2021-09-07T06:43:10Z-
dc.date.available2021-09-07T06:43:10Z-
dc.date.created2021-06-18-
dc.date.issued2011-11-
dc.identifier.issn0361-5235-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/111273-
dc.description.abstractWe investigated the light output power of blue light-emitting diodes (LEDs) fabricated with AgNi contacts as a function of the Ni content. Annealing the AgNi contacts at 400A degrees C in air significantly improved their electrical characteristics. The AgNi samples with 10.0 wt.% Ni showed reflectance of 80.9% at 460 nm, whereas the Ag-only contacts gave 71.1%. After annealing at 400A degrees C, the AgNi contacts exhibited better thermal stability than did the Ag-only contacts. Their current-voltage relationships showed that blue LEDs fabricated with Ag-only contacts gave a forward voltage of 3.33 V at 20 mA, whereas those fabricated with AgNi contacts with 10.0 wt.% Ni produced 3.03 V. LEDs fabricated with the AgNi contacts exhibited output power higher by 5.9% to 19.1% than those with Ag-only contacts. Based on scanning electron microscopy and x-ray photoemission spectroscopy results, the improved thermal and electrical behaviors are described and discussed.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherSPRINGER-
dc.subjectP-TYPE GAN-
dc.subjectOHMIC CONTACTS-
dc.subjectLOW-RESISTANCE-
dc.subjectEXTRACTION EFFICIENCY-
dc.subjectSURFACES-
dc.subjectALLOY-
dc.subjectNI/AU-
dc.subjectFILMS-
dc.subjectAU-
dc.titleImproved Light Output of GaN-Based Light-Emitting Diodes by Using AgNi Reflective Contacts-
dc.typeArticle-
dc.contributor.affiliatedAuthorSeong, Tae-Yeon-
dc.identifier.doi10.1007/s11664-011-1745-3-
dc.identifier.scopusid2-s2.0-83155181566-
dc.identifier.wosid000295365500001-
dc.identifier.bibliographicCitationJOURNAL OF ELECTRONIC MATERIALS, v.40, no.11, pp.2173 - 2178-
dc.relation.isPartOfJOURNAL OF ELECTRONIC MATERIALS-
dc.citation.titleJOURNAL OF ELECTRONIC MATERIALS-
dc.citation.volume40-
dc.citation.number11-
dc.citation.startPage2173-
dc.citation.endPage2178-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusP-TYPE GAN-
dc.subject.keywordPlusOHMIC CONTACTS-
dc.subject.keywordPlusLOW-RESISTANCE-
dc.subject.keywordPlusEXTRACTION EFFICIENCY-
dc.subject.keywordPlusSURFACES-
dc.subject.keywordPlusALLOY-
dc.subject.keywordPlusNI/AU-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusAU-
dc.subject.keywordAuthorLight-emitting diodes-
dc.subject.keywordAuthorAgNi-
dc.subject.keywordAuthorohmic contact-
dc.subject.keywordAuthorreflectivity-
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SEONG, TAE YEON
공과대학 (신소재공학부)
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